#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204664
Mfr serial number	STN11775-04664

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204664

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11043
I_LEAK350V (microA)	0.1736
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.43
20	49.01
30	56.04
40	61.65
50	67.14
60	72.33
70	77.31
80	82.1
90	86.65
100	90.99
110	95.16
120	99.19
130	103.11
140	106.91
150	110.43
160	114.28
170	117.88
180	121.4
190	124.87
200	128.29
210	131.71
220	135.07
230	138.37
240	141.67
250	144.47
260	147.48
270	150.27
280	153.45
290	156.51
300	159.6
310	162.56
320	165.52
330	168.19
340	171.04
350	173.6
	
#CV	
10	
15	O.L.
20	2951.31
25	2426.65
30	2090.48
35	1857.25
40	1688.18
45	1568.19
50	1491.36
55	1448.71
60	1428.57
65	1419.85
70	1415.77
75	1413.29
80	1411.69
85	1410.38
90	1409.37
95	1408.51
100	1407.62
105	1406.98
110	1406.28
115	1405.8
120	1405.4

#End of manufacturer data file