#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204669
Mfr serial number	STN11775-04669

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204669

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12324
I_LEAK350V (microA)	0.1951
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	607																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.69
20	53.16
30	61.14
40	67.18
50	72.98
60	78.78
70	84.8
80	90.43
90	95.72
100	100.72
110	105.53
120	110.16
130	114.66
140	119
150	123.24
160	127.41
170	131.48
180	135.48
190	139.42
200	143.26
210	147.12
220	150.87
230	154.59
240	158.27
250	161.93
260	165.53
270	169.08
280	172.62
290	175.9
300	179.16
310	182.5
320	186
330	188.9
340	192.2
350	195.1
	
#CV	
10	
15	O.L.
20	2841.87
25	2337.88
30	2017.28
35	1793.09
40	1632.23
45	1523.78
50	1463.14
55	1434.48
60	1422.81
65	1417.56
70	1414.75
75	1412.76
80	1411.29
85	1410.03
90	1408.9
95	1407.98
100	1407.14
105	1406.37
110	1405.88
115	1405.27
120	1404.84

#End of manufacturer data file