#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204672
Mfr serial number	STN11775-04672

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204672

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.08371
I_LEAK350V (microA)	0.12551
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	15.222
20	38.48
30	43.65
40	47.44
50	51.03
60	54.8
70	58.61
80	62.23
90	65.57
100	68.9
110	72.12
120	75.31
130	78.19
140	81
150	83.71
160	86.33
170	88.79
180	91.33
190	93.67
200	95.96
210	98.27
220	100.46
230	102.65
240	104.72
250	106.87
260	108.84
270	110.87
280	112.86
290	114.82
300	116.68
310	118.58
320	120.32
330	122.07
340	123.85
350	125.51
	
#CV	
10	
15	O.L.
20	2832.14
25	2331.74
30	2014.8
35	1791.4
40	1635.06
45	1532.07
50	1474.04
55	1446.39
60	1434.82
65	1429.49
70	1426.64
75	1424.64
80	1422.98
85	1421.49
90	1420.22
95	1419.18
100	1418.17
105	1417.24
110	1416.48
115	1415.74
120	1414.95

#End of manufacturer data file