#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204673
Mfr serial number	STN11775-04673

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204673

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12904
I_LEAK350V (microA)	0.2541
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.25
20	56.3
30	64.45
40	70.5
50	76.45
60	82.8
70	88.81
80	94.49
90	99.84
100	104.98
110	110.03
120	114.91
130	119.76
140	124.42
150	129.04
160	133.43
170	138
180	142.59
190	147.19
200	151.44
210	156.5
220	161.02
230	166.7
240	171.76
250	177.71
260	183.5
270	188.3
280	195.9
290	203.4
300	211.3
310	219.8
320	229.3
330	236.8
340	246.6
350	254.1
	
#CV	
10	
15	O.L.
20	2833.77
25	2330.2
30	2009.74
35	1786.06
40	1627.16
45	1521.76
50	1462.97
55	1435.42
60	1424.05
65	1418.99
70	1416.32
75	1414.36
80	1412.92
85	1411.61
90	1410.73
95	1409.85
100	1409.1
105	1408.44
110	1407.84
115	1407.45
120	1406.74

#End of manufacturer data file