#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204676
Mfr serial number	STN11775-04676

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204676

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10815
I_LEAK350V (microA)	0.16915
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.8
20	47.95
30	55.03
40	60.29
50	65.16
60	70.2
70	75.31
80	80.14
90	84.69
100	89.01
110	92.99
120	97.06
130	100.86
140	104.55
150	108.15
160	111.67
170	115.12
180	118.49
190	121.81
200	125.07
210	128.27
220	131.42
230	134.55
240	137.61
250	140.63
260	143.64
270	146.59
280	149.46
290	152.39
300	155.22
310	158.09
320	160.73
330	163.5
340	166.31
350	169.15
	
#CV	
10	
15	O.L.
20	2896.6
25	2384.11
30	2058.2
35	1829.9
40	1664.46
45	1548.22
50	1477.09
55	1440.07
60	1423.68
65	1416.55
70	1413.03
75	1410.86
80	1409.22
85	1407.96
90	1406.91
95	1405.84
100	1404.98
105	1404.25
110	1403.55
115	1403.09
120	1402.45

#End of manufacturer data file