#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204679
Mfr serial number	STN11775-04679

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204679

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09121
I_LEAK350V (microA)	0.13705
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.28
20	41.39
30	47.13
40	51.4
50	55.2
60	59.18
70	63.33
80	67.56
90	71.54
100	75.31
110	78.77
120	82.15
130	85.22
140	88.25
150	91.21
160	94.07
170	96.76
180	99.51
190	102.12
200	104.61
210	107.19
220	109.57
230	111.97
240	114.25
250	116.64
260	118.84
270	121.08
280	123.23
290	125.34
300	127.36
310	129.45
320	131.36
330	133.27
340	135.23
350	137.05
	
#CV	
10	
15	O.L.
20	2907.96
25	2393.3
30	2067.21
35	1837.49
40	1673.79
45	1559.67
50	1490.33
55	1454.06
60	1437.53
65	1430.28
70	1426.56
75	1424.2
80	1422.4
85	1420.94
90	1419.77
95	1418.72
100	1417.78
105	1417.01
110	1416.15
115	1415.55
120	1414.84

#End of manufacturer data file