#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204687
Mfr serial number	STN11776-04687

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204687

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13894
I_LEAK350V (microA)	0.223
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.39
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	11																																							
Pinhole	95																																							
Pinhole	196																																							
Pinhole	402																																							
Pinhole	507																																							
Pinhole	747																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	39.67
20	59.62
30	67.03
40	73.98
50	81.19
60	88.02
70	94.62
80	100.89
90	106.87
100	112.64
110	118.16
120	123.28
130	128.77
140	133.9
150	138.94
160	143.9
170	148.7
180	153.53
190	158.25
200	162.95
210	167.54
220	171.69
230	175.86
240	179.74
250	184.5
260	188.8
270	192.8
280	196.8
290	200.8
300	205.2
310	209.3
320	212.8
330	216.3
340	220
350	223
	
#CV	
10	
15	O.L.
20	2929.9
25	2410.55
30	2079.43
35	1847.65
40	1679.27
45	1558.92
50	1482.64
55	1442.06
60	1424.06
65	1416.63
70	1413.06
75	1410.85
80	1409.17
85	1408.03
90	1406.91
95	1405.97
100	1405.18
105	1404.48
110	1403.74
115	1403.2
120	1402.68

#End of manufacturer data file