#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204736
Mfr serial number	STN11646-04736

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204736

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11114
I_LEAK350V (microA)	0.1706
Substr Origin	126
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.25
20	51.78
30	59.17
40	64.84
50	69.67
60	74.63
70	79.66
80	84.34
90	88.69
100	92.76
110	96.68
120	100.41
130	104.09
140	107.66
150	111.14
160	114.52
170	117.85
180	121.05
190	124.24
200	127.42
210	130.42
220	133.51
230	136.43
240	139.53
250	142.26
260	145.32
270	148.07
280	151.29
290	154.02
300	156.83
310	159.24
320	162.17
330	164.81
340	167.73
350	170.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2484.03
30	2141.5
35	1900.02
40	1724.66
45	1593.42
50	1503.04
55	1451.33
60	1427.23
65	1417.19
70	1412.62
75	1409.85
80	1407.93
85	1406.4
90	1405.1
95	1404
100	1403
105	1402.08
110	1401.36
115	1400.59
120	1399.8

#End of manufacturer data file