#General information ITEM section %ITEM SERIAL NUMBER 20220900204747 Mfr serial number STN11646-04747 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 22/08/2001 PROBLEM NO PASSED YES Run number 20220900204747 #Test data Data section %DATA TEMPERATURE (C) 25 I_LEAK150V (microA) 0.10016 I_LEAK350V (microA) 0.14863 Substr Origin 126 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 292 Vdep (V) 60 R Bias Upper (MOhm) 1.48 R Bias Lower (MOhm) 1.35 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 34.27 20 47.61 30 54.02 40 58.77 50 63.03 60 67.47 70 72.12 80 76.42 90 80.35 100 84.01 110 87.5 120 90.84 130 94.05 140 97.14 150 100.16 160 103.11 170 105.93 180 108.74 190 111.48 200 114.15 210 116.8 220 119.37 230 121.88 240 124.36 250 126.76 260 129.1 270 131.41 280 133.7 290 135.93 300 138.08 310 140.22 320 142.36 330 144.49 340 146.46 350 148.63 #CV 10 15 O.L. 20 2959.58 25 2428.43 30 2094.31 35 1858.47 40 1688.24 45 1564.93 50 1487.23 55 1447.45 60 1430.52 65 1423.31 70 1419.64 75 1417.22 80 1415.4 85 1413.92 90 1412.69 95 1411.56 100 1410.58 105 1409.71 110 1409.01 115 1408.25 120 1407.52 #End of manufacturer data file