#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204749
Mfr serial number	STN11646-04749

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204749

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10872
I_LEAK350V (microA)	0.16232
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	65
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38
20	53.54
30	60.42
40	65.7
50	70.23
60	74.81
70	79.37
80	83.7
90	87.77
100	91.61
110	95.27
120	98.79
130	102.19
140	105.47
150	108.72
160	111.84
170	114.95
180	117.97
190	120.91
200	123.83
210	126.72
220	129.54
230	132.32
240	135
250	137.59
260	140.12
270	142.63
280	145.2
290	147.75
300	150.09
310	152.75
320	155.17
330	157.63
340	159.97
350	162.32
	
#CV	
10	
15	O.L.
20	O.L.
25	2583.07
30	2225.09
35	1973.37
40	1789.28
45	1650.3
50	1548.52
55	1481.33
60	1443.64
65	1425.5
70	1417.37
75	1413.45
80	1411.08
85	1409.24
90	1407.86
95	1406.57
100	1405.44
105	1404.52
110	1403.77
115	1402.96
120	1402.23

#End of manufacturer data file