#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204750
Mfr serial number	STN11646-04750

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204750

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11699
I_LEAK350V (microA)	0.17531
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.63
20	55.87
30	63.68
40	69.45
50	74.61
60	79.78
70	84.75
80	89.38
90	93.89
100	98.11
110	102.15
120	106.02
130	109.81
140	113.41
150	116.99
160	120.45
170	123.84
180	127.13
190	130.35
200	133.43
210	136.45
220	139.49
230	142.46
240	145.31
250	148.27
260	151.19
270	153.99
280	156.78
290	159.53
300	162.24
310	164.9
320	167.55
330	170.17
340	172.78
350	175.31
	
#CV	
10	
15	O.L.
20	O.L.
25	2628.17
30	2263.07
35	2006.96
40	1817.96
45	1674.22
50	1566.42
55	1493.39
60	1451.39
65	1430.81
70	1421.53
75	1417.14
80	1414.61
85	1412.72
90	1411.29
95	1410
100	1408.98
105	1408.04
110	1407.28
115	1406.53
120	1405.75

#End of manufacturer data file