#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204757
Mfr serial number	STN11646-04757

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204757

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12084
I_LEAK350V (microA)	0.1833
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.32
20	56.76
30	64.71
40	70.56
50	75.73
60	81.22
70	86.63
80	91.59
90	96.44
100	100.89
110	105.15
120	109.27
130	113.23
140	117.11
150	120.84
160	124.55
170	128.14
180	131.64
190	135.1
200	138.5
210	141.85
220	145.14
230	148.35
240	151.54
250	154.64
260	157.66
270	160.71
280	163.66
290	166.61
300	169.49
310	172.26
320	175.12
330	177.96
340	180.73
350	183.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2558.06
30	2202.41
35	1952.87
40	1769.75
45	1632.55
50	1534.95
55	1474.66
60	1443.44
65	1429.04
70	1422.43
75	1419.01
80	1416.89
85	1415.11
90	1413.77
95	1412.48
100	1411.49
105	1410.53
110	1409.8
115	1409.05
120	1408.16

#End of manufacturer data file