#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204762
Mfr serial number	STN11646-04762

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204762

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12157
I_LEAK350V (microA)	0.1851
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.26
20	56.9
30	64.7
40	70.55
50	75.9
60	81.58
70	87.06
80	92.12
90	96.85
100	101.34
110	105.65
120	109.81
130	113.85
140	117.75
150	121.57
160	125.32
170	128.97
180	132.57
190	136.12
200	139.59
210	143.01
220	146.29
230	149.52
240	152.66
250	155.75
260	158.63
270	161.93
280	165
290	167.99
300	170.94
310	173.87
320	176.75
330	179.66
340	182.3
350	185.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2542.51
30	2189.38
35	1941.18
40	1759.96
45	1624.28
50	1528.95
55	1470.92
60	1441.32
65	1428.1
70	1422.17
75	1418.97
80	1416.7
85	1414.96
90	1413.68
95	1412.36
100	1411.25
105	1410.19
110	1409.45
115	1408.79
120	1408

#End of manufacturer data file