#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204764
Mfr serial number	STN11646-04764

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204764

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.3614
I_LEAK350V (microA)	0.6274
Substr Origin	120
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	294
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	198																																							
Pinhole	234																																							
Pinhole	249																																							
Pinhole	334																																							
Pinhole	435																																							
Pinhole	456																																							
Pinhole	478																																							
Short																																								
Open																																								

%WEBLINK	
#DESCRIPTION	URL

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	100.66
20	146.5
30	174.73
40	196.2
50	214.2
60	231.4
70	247.9
80	263.5
90	278.4
100	293
110	307.1
120	321
130	334.6
140	348.1
150	361.4
160	374.9
170	388.2
180	401.6
190	415
200	428.5
210	442.3
220	455.8
230	469
240	482.9
250	495.9
260	509.3
270	522.4
280	535.5
290	548.5
300	561.9
310	574.7
320	587.9
330	601.8
340	615.2
350	627.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2532.9
30	2183.87
35	1938.73
40	1757.67
45	1620.02
50	1519.32
55	1458.92
60	1431.83
65	1421.26
70	1416.45
75	1413.61
80	1411.5
85	1409.84
90	1408.39
95	1407.23
100	1406.06
105	1405.07
110	1404.21
115	1403.32
120	1402.55

#End of manufacturer data file