#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204767
Mfr serial number	STN11777-04767

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204767

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1358
I_LEAK350V (microA)	0.2085
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.44
20	62.96
30	72.03
40	78.69
50	84.53
60	90.49
70	96.78
80	102.61
90	107.98
100	112.99
110	117.9
120	122.55
130	127.08
140	131.49
150	135.8
160	139.99
170	144.03
180	148.04
190	151.96
200	155.69
210	159.72
220	163.52
230	167.24
240	170.93
250	174.54
260	178.11
270	181.8
280	185.2
290	188.5
300	191.9
310	195.3
320	198.61
330	202
340	205.4
350	208.5
	
#CV	
10	
15	O.L.
20	2926.81
25	2404.34
30	2073.66
35	1842.07
40	1674.67
45	1558
50	1487.68
55	1451.93
60	1435.97
65	1428.74
70	1424.84
75	1422.24
80	1420.32
85	1418.72
90	1417.29
95	1416.17
100	1415.04
105	1414.14
110	1413.4
115	1412.58
120	1411.88

#End of manufacturer data file