#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204768
Mfr serial number	STN11777-04768

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204768

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13783
I_LEAK350V (microA)	0.211
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	55
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.6
20	63.04
30	72.59
40	80
50	86.13
60	92.1
70	98.3
80	104.21
90	109.68
100	114.83
110	119.71
120	124.4
130	129
140	133.46
150	137.83
160	142.07
170	145.98
180	150.25
190	154.25
200	158.23
210	162.11
220	165.95
230	169.7
240	173.4
250	177.05
260	180.7
270	184.1
280	187.7
290	191.1
300	194.6
310	198
320	201.3
330	204.7
340	207.9
350	211
	
#CV	
10	
15	O.L.
20	2907.5
25	2387.74
30	2059.05
35	1829.68
40	1664.21
45	1551.47
50	1485.37
55	1452.72
60	1438.13
65	1431.25
70	1427.41
75	1424.84
80	1422.94
85	1421.25
90	1419.9
95	1418.68
100	1417.63
105	1416.63
110	1415.91
115	1415.03
120	1414.32

#End of manufacturer data file