#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204770
Mfr serial number	STN11777-04770

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204770

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1322
I_LEAK350V (microA)	0.1993
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	527																																							
Pinhole	553																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	42.73
20	62.44
30	71.81
40	78.02
50	83.68
60	89.33
70	95.03
80	100.62
90	105.84
100	110.73
110	115.35
120	119.76
130	123.9
140	128.16
150	132.2
160	136.14
170	139.91
180	143.67
190	147.34
200	150.96
210	154.51
220	158.02
230	161.25
240	164.82
250	168.16
260	171.44
270	174.6
280	177.81
290	181.1
300	184.2
310	187.23
320	190.3
330	193.3
340	196.4
350	199.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2481.9
30	2138
35	1898.09
40	1721.84
45	1594.87
50	1511.88
55	1464.87
60	1441.72
65	1431.07
70	1425.88
75	1422.87
80	1420.71
85	1418.98
90	1417.59
95	1416.3
100	1415.2
105	1414.29
110	1413.46
115	1412.63
120	1412.11

#End of manufacturer data file