#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204771
Mfr serial number	STN11777-04771

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204771

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14082
I_LEAK350V (microA)	0.219
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	55
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.07
20	65.03
30	74.4
40	81.34
50	87.33
60	93.35
70	99.66
80	105.84
90	111.58
100	116.96
110	122.04
120	126.93
130	131.67
140	136.3
150	140.82
160	145.25
170	149.49
180	153.51
190	157.9
200	162.04
210	166.1
220	170.13
230	174.12
240	178.07
250	182
260	185.8
270	189.48
280	193.4
290	197.1
300	200.9
310	204.5
320	208.1
330	211.9
340	215.4
350	219
	
#CV	
10	
15	O.L.
20	2879.52
25	2364.87
30	2039.55
35	1813.29
40	1652.48
45	1545.92
50	1483.66
55	1452.32
60	1438.26
65	1431.75
70	1427.88
75	1425.33
80	1423.4
85	1421.77
90	1420.33
95	1419.17
100	1418.06
105	1417.09
110	1416.27
115	1415.37
120	1414.69

#End of manufacturer data file