#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204772
Mfr serial number	STN11777-04772

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204772

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.17857
I_LEAK350V (microA)	0.2836
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	56.08
20	81.41
30	92.98
40	101.14
50	108.38
60	116.29
70	125.3
80	132.54
90	139.75
100	146.67
110	153.23
120	159.7
130	166.06
140	172.33
150	178.57
160	185
170	191
180	197.3
190	203.8
200	210.4
210	217
220	223.7
230	230.5
240	237.2
250	243.7
260	249.2
270	254.5
280	259.9
290	265.2
300	269.6
310	273.2
320	276.5
330	279.1
340	281.6
350	283.6
	
#CV	
10	
15	O.L.
20	2928.49
25	2403.24
30	2070.99
35	1839.23
40	1671.78
45	1556.14
50	1486.37
55	1450.61
60	1434.21
65	1426.53
70	1422.16
75	1419.3
80	1417.07
85	1415.23
90	1413.7
95	1412.31
100	1411.2
105	1410.22
110	1409.42
115	1408.71
120	1408.11

#End of manufacturer data file