#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204775
Mfr serial number	STN11777-04775

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204775

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13857
I_LEAK350V (microA)	0.2121
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.97
20	65.75
30	74.16
40	81.01
50	86.88
60	92.7
70	98.83
80	104.86
90	110.4
100	115.61
110	120.5
120	125.12
130	129.8
140	134.24
150	138.57
160	142.79
170	146.85
180	150.9
190	154.87
200	158.81
210	162.65
220	166.21
230	170.17
240	173.87
250	177.56
260	181.2
270	184.7
280	188.17
290	191.8
300	195.2
310	198.54
320	202.1
330	205.4
340	208.9
350	212.1
	
#CV	
10	
15	O.L.
20	2933.51
25	2407.32
30	2075.39
35	1844.74
40	1677.82
45	1563.86
50	1494.59
55	1458.3
60	1441.71
65	1434.08
70	1429.92
75	1427.21
80	1425.16
85	1423.46
90	1422.07
95	1420.8
100	1419.71
105	1418.69
110	1417.9
115	1417.06
120	1416.34

#End of manufacturer data file