#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204776
Mfr serial number	STN11777-04776

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204776

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1812
I_LEAK350V (microA)	0.2601
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	64.93
20	94.85
30	108.55
40	118.69
50	126.18
60	132.67
70	139.35
80	145.66
90	151.44
100	156.86
110	161.99
120	166.8
130	171.75
140	176.47
150	181.2
160	185.7
170	190
180	194.4
190	198.7
200	202.9
210	207
220	211.1
230	215.2
240	219.2
250	223.2
260	227.2
270	230.9
280	235
290	238.5
300	242.5
310	246.2
320	249.8
330	253.2
340	256.5
350	260.1
	
#CV	
10	
15	O.L.
20	2975
25	2448.77
30	2114.22
35	1879.62
40	1704.56
45	1578.34
50	1496.84
55	1452.49
60	1431.97
65	1422.88
70	1418.21
75	1415.35
80	1413.2
85	1411.51
90	1410.07
95	1408.82
100	1407.7
105	1406.74
110	1405.91
115	1405.17
120	1404.32

#End of manufacturer data file