#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204777
Mfr serial number	STN11777-04777

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204777

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1421
I_LEAK350V (microA)	0.2184
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.02
20	66.98
30	76.7
40	83.86
50	89.91
60	95.85
70	102.22
80	108.19
90	113.72
100	118.81
110	123.82
120	128.59
130	133.16
140	137.63
150	142.1
160	146.35
170	150.51
180	154.69
190	158.82
200	162.68
210	166.86
220	170.77
230	174.75
240	178.66
250	182.6
260	186.2
270	189.9
280	193.4
290	197.1
300	200.6
310	204.4
320	208
330	211.5
340	214.9
350	218.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2531.93
30	2181.09
35	1937.05
40	1755.11
45	1619.76
50	1524.66
55	1466.43
60	1436.49
65	1422.95
70	1416.76
75	1413.37
80	1411.02
85	1409.2
90	1407.7
95	1406.4
100	1405.3
105	1404.26
110	1403.53
115	1402.64
120	1401.95

#End of manufacturer data file