#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204778
Mfr serial number	STN11777-04778

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204778

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13028
I_LEAK350V (microA)	0.1941
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.89
20	63.88
30	72.8
40	79.31
50	84.77
60	90.02
70	95.46
80	100.69
90	105.54
100	110.13
110	114.46
120	118.59
130	122.58
140	126.46
150	130.28
160	133.83
170	137.54
180	141.13
190	144.61
200	148.02
210	151.45
220	154.75
230	158.05
240	161.25
250	164.4
260	167.29
270	170.48
280	173.56
290	176.59
300	179.59
310	182.6
320	185.5
330	188.34
340	191.3
350	194.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2488.19
30	2143.07
35	1902.48
40	1724.74
45	1595.22
50	1508.47
55	1458.4
60	1433.98
65	1422.93
70	1417.5
75	1414.32
80	1412.11
85	1410.37
90	1408.91
95	1407.68
100	1406.53
105	1405.53
110	1404.77
115	1403.92
120	1403.3

#End of manufacturer data file