#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204779
Mfr serial number	STN11777-04779

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204779

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.219
I_LEAK350V (microA)	0.2907
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	445																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	81.57
20	114.8
30	136.11
40	152.39
50	164.75
60	173.94
70	180.6
80	186.4
90	191.7
100	196.7
110	201.5
120	206
130	210.4
140	214.8
150	219
160	223
170	227
180	231
190	234.8
200	238.7
210	242.5
220	246.2
230	249.9
240	253.5
250	256.9
260	260.5
270	264
280	267.5
290	270.8
300	274.2
310	277.6
320	280.9
330	284.2
340	287.5
350	290.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2738.59
30	2376.5
35	2118.27
40	1920.58
45	1766.75
50	1645.32
55	1551.38
60	1485.64
65	1446.02
70	1426.11
75	1417.19
80	1412.78
85	1410.23
90	1408.41
95	1406.97
100	1405.8
105	1404.76
110	1403.93
115	1403.09
120	1402.27

#End of manufacturer data file