#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204780
Mfr serial number	STN11777-04780

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204780

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1388
I_LEAK350V (microA)	0.2126
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.51
R Bias Lower (MOhm)	1.22

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.43
20	64.49
30	73.76
40	81.12
50	87.67
60	93.79
70	99.84
80	105.63
90	111
100	116.08
110	120.94
120	125.55
130	130.1
140	134.61
150	138.8
160	143.13
170	147.2
180	151.21
190	155.07
200	159.06
210	162.89
220	166.67
230	170.45
240	173.96
250	177.31
260	181.2
270	184.8
280	188.36
290	191.9
300	195.3
310	198.6
320	202
330	205.4
340	208.7
350	212.6
	
#CV	
10	
15	O.L.
20	2904.63
25	2384.17
30	2055.98
35	1827.85
40	1661.54
45	1547.36
50	1478.33
55	1443.18
60	1427.64
65	1420.61
70	1416.77
75	1414.16
80	1412.17
85	1410.54
90	1409.14
95	1407.92
100	1406.82
105	1405.81
110	1404.97
115	1404.07
120	1403.37

#End of manufacturer data file