#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204795
Mfr serial number	STN11778-04795

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204795

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12735
I_LEAK350V (microA)	0.1973
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.6
20	60.18
30	68.14
40	74.13
50	79.48
60	85.32
70	90.77
80	96.14
90	101.05
100	105.78
110	110.31
120	114.81
130	119.06
140	123.31
150	127.35
160	131.4
170	135.23
180	139.21
190	142.94
200	146.82
210	150.21
220	154.18
230	157.73
240	161.15
250	164.35
260	167.74
270	170.94
280	174.15
290	177.68
300	181
310	184.3
320	187.8
330	191.05
340	194.5
350	197.3
	
#CV	
10	
15	O.L.
20	2993.1
25	2457.81
30	2119.07
35	1881.11
40	1708.95
45	1583.02
50	1500.18
55	1453.63
60	1431.62
65	1421.97
70	1417.24
75	1414.4
80	1412.33
85	1410.75
90	1409.44
95	1408.24
100	1407.24
105	1406.27
110	1405.65
115	1404.73
120	1404.16

#End of manufacturer data file