#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204799
Mfr serial number	STN11778-04799

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204799

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1135
I_LEAK350V (microA)	0.17319
Substr Origin	128
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open	138																																							

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.66
20	53.78
30	61.2
40	67.04
50	71.53
60	76.57
70	81.59
80	86.06
90	90.53
100	94.72
110	98.79
120	102.63
130	106.39
140	109.88
150	113.5
160	116.95
170	120.27
180	123.65
190	126.95
200	130.18
210	133.33
220	136.51
230	139.47
240	142.52
250	145.77
260	148.5
270	151.31
280	154.06
290	156.96
300	159.74
310	162.44
320	164.96
330	167.8
340	170.29
350	173.19
	
#CV	
10	
15	O.L.
20	O.L.
25	2576.58
30	2221.3
35	1971.63
40	1788.75
45	1649.7
50	1548.06
55	1481.94
60	1445.36
65	1427.42
70	1419.33
75	1415.27
80	1412.82
85	1411.05
90	1409.62
95	1408.4
100	1407.32
105	1406.34
110	1405.62
115	1405.05
120	1404.19

#End of manufacturer data file