#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900205147
Mfr serial number	STN11929-05147

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/09/2001
PROBLEM	NO
PASSED	YES
Run number	20220900205147

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13934
I_LEAK350V (microA)	0.2178
Substr Origin	145
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.22
20	62.14
30	72.27
40	79.84
50	87.02
60	93.19
70	98.89
80	104.58
90	110.02
100	115.33
110	120.37
120	125.23
130	130.05
140	134.74
150	139.34
160	143.79
170	148.19
180	152.6
190	156.99
200	161.3
210	165.68
220	169.87
230	174.13
240	178.33
250	182.4
260	186.3
270	190.4
280	194
290	197.9
300	201.1
310	205
320	208.2
330	211.5
340	214.9
350	217.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2835.9
30	2443.38
35	2167.47
40	1962.2
45	1804.14
50	1678.74
55	1578.56
60	1504.72
65	1456.92
70	1430.31
75	1417.54
80	1411.45
85	1408.45
90	1406.52
95	1405.12
100	1404.1
105	1403.26
110	1402.63
115	1401.94
120	1401.49

#End of manufacturer data file