#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900205157
Mfr serial number	STN11929-05157

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/09/2001
PROBLEM	NO
PASSED	YES
Run number	20220900205157

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.14098
I_LEAK350V (microA)	0.2206
Substr Origin	143
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	349																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.43
20	61.95
30	71.27
40	78.15
50	85.1
60	91.54
70	97.85
80	103.9
90	109.59
100	115.18
110	120.49
120	125.76
130	130.9
140	136.01
150	140.98
160	146.05
170	150.86
180	155.82
190	160.83
200	165.94
210	171.08
220	176.27
230	181.1
240	185.3
250	189.3
260	193.3
270	196.9
280	200.8
290	204.3
300	207.9
310	211.2
320	213.9
330	216.4
340	218.7
350	220.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2479.68
30	2141.84
35	1902.21
40	1727.21
45	1595.64
50	1505.87
55	1455.66
60	1433.13
65	1424.07
70	1419.78
75	1417.28
80	1415.58
85	1414.14
90	1412.92
95	1411.85
100	1411.06
105	1410.27
110	1409.82
115	1409.2
120	1408.82

#End of manufacturer data file