#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900205496
Mfr serial number	STN12018-05496

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/10/2001
PROBLEM	NO
PASSED	YES
Run number	20220900205496

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14526
I_LEAK350V (microA)	0.2248
Substr Origin	149
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	70
R Bias Upper (MOhm)	1.5
R Bias Lower (MOhm)	1.24

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.18
20	63.16
30	73.29
40	81.59
50	88.89
60	95.63
70	101.95
80	108.09
90	113.99
100	119.45
110	125.05
120	130.33
130	135.36
140	140.3
150	145.26
160	150.03
170	154.78
180	159.5
190	164.08
200	168.55
210	173.04
220	177.37
230	181.6
240	185.7
250	189.9
260	193.9
270	197.8
280	201.7
290	205.5
300	208.8
310	212.3
320	215.7
330	218.9
340	221.8
350	224.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2890.88
30	2488.32
35	2208.56
40	1996.83
45	1834.7
50	1706.44
55	1602.53
60	1523.65
65	1471.12
70	1441.69
75	1427.53
80	1421.05
85	1417.89
90	1415.86
95	1414.43
100	1413.33
105	1412.44
110	1411.65
115	1411.14
120	1410.49

#End of manufacturer data file