#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900205667
Mfr serial number	STN12031-05667

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/10/2001
PROBLEM	NO
PASSED	YES
Run number	20220900205667

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14872
I_LEAK350V (microA)	0.2387
Substr Origin	165
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	55
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	529																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.57
20	62.9
30	72.81
40	79.08
50	86.6
60	94.37
70	101.45
80	108.21
90	114.51
100	120.67
110	126.48
120	132.15
130	137.89
140	143.3
150	148.72
160	153.94
170	159.3
180	164.41
190	169.41
200	174.43
210	179.38
220	184.2
230	188.9
240	193.8
250	198.5
260	203.3
270	207.9
280	212.3
290	216.5
300	220.7
310	224.2
320	228.3
330	231.9
340	235.4
350	238.7
	
#CV	
10	
15	O.L.
20	2828.62
25	2328.25
30	2009.72
35	1785.72
40	1625.47
45	1519.4
50	1461.26
55	1434.46
60	1423.94
65	1419.16
70	1416.54
75	1414.58
80	1413.04
85	1411.93
90	1410.95
95	1409.92
100	1409.11
105	1408.53
110	1407.81
115	1407.3
120	1406.81

#End of manufacturer data file