#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900205887
Mfr serial number	STN12137-05887

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/10/2001
PROBLEM	NO
PASSED	YES
Run number	20220900205887

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11848
I_LEAK350V (microA)	0.17946
Substr Origin	176
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	80
R Bias Upper (MOhm)	1.39
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36
20	50.84
30	59.17
40	66.09
50	72.72
60	78.63
70	83.85
80	88.84
90	93.71
100	98.2
110	102.79
120	106.93
130	110.94
140	114.76
150	118.48
160	122.1
170	125.61
180	129.08
190	132.42
200	135.72
210	138.97
220	142.12
230	145.3
240	148.37
250	151.44
260	154.43
270	157.39
280	160.33
290	163.22
300	166.07
310	168.88
320	171.63
330	174.36
340	176.84
350	179.46
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2671.29
35	2365.96
40	2138.89
45	1964.92
50	1825.81
55	1711.76
60	1618.37
65	1544.08
70	1490.5
75	1456.65
80	1437.51
85	1428.05
90	1423.14
95	1420.66
100	1418.94
105	1417.53
110	1416.86
115	1416.02
120	1415.57

#End of manufacturer data file