#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206279
Mfr serial number	STN12156-06279

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206279

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09327
I_LEAK350V (microA)	0.13297
Substr Origin	164
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	80
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.42

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.39
20	45.17
30	52.26
40	57.54
50	62
60	65.83
70	69.2
80	72.56
90	75.95
100	79.25
110	82.34
120	85.29
130	88.06
140	90.7
150	93.27
160	95.71
170	98.12
180	100.4
190	102.66
200	104.86
210	107
220	109.12
230	111.14
240	113.13
250	115.11
260	117.02
270	118.9
280	120.76
290	122.55
300	124.36
310	126.13
320	127.88
330	129.65
340	131.3
350	132.97
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2786.44
35	2457.68
40	2209.7
45	2014.72
50	1861.34
55	1735.59
60	1633.14
65	1551.17
70	1492.58
75	1456.92
80	1438.06
85	1429.16
90	1424.63
95	1422.14
100	1420.51
105	1419.25
110	1418.24
115	1417.45
120	1416.5

#End of manufacturer data file