#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206426
Mfr serial number	STN12162-06426

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	29/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206426

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09271
I_LEAK350V (microA)	0.13672
Substr Origin	186
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.47
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.66
20	40.99
30	47.35
40	52.7
50	57.72
60	62.1
70	66.06
80	69.94
90	73.72
100	77.29
110	80.68
120	83.89
130	86.94
140	89.88
150	92.71
160	95.45
170	98.11
180	100.69
190	103.2
200	105.66
210	108.04
220	110.37
230	112.65
240	114.9
250	117.05
260	119.22
270	121.36
280	123.4
290	125.45
300	127.48
310	129.4
320	131.27
330	133.19
340	134.98
350	136.72
	
#CV	
10	
15	O.L.
20	O.L.
25	2965.07
30	2556.03
35	2272.09
40	2056.74
45	1891.79
50	1760.97
55	1653.89
60	1569.35
65	1507.4
70	1467.72
75	1445.54
80	1434.3
85	1428.9
90	1426.02
95	1424.14
100	1422.73
105	1421.57
110	1420.71
115	1419.81
120	1418.96

#End of manufacturer data file