#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206434
Mfr serial number	STN12162-06434

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	29/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206434

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09689
I_LEAK350V (microA)	0.14389
Substr Origin	186
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.47
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.52
20	43.69
30	50.42
40	55.89
50	60.81
60	65.3
70	69.43
80	73.38
90	77.23
100	80.92
110	84.41
120	87.75
130	90.9
140	93.95
150	96.89
160	99.77
170	102.54
180	105.24
190	107.89
200	110.46
210	112.98
220	115.44
230	117.86
240	120.21
250	122.53
260	124.83
270	127.06
280	129.29
290	131.48
300	133.63
310	135.75
320	137.86
330	139.93
340	141.92
350	143.89
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2589.29
35	2301.67
40	2083.63
45	1916.24
50	1783.46
55	1674.25
60	1586.45
65	1519.45
70	1474.66
75	1448.6
80	1435
85	1428.52
90	1425.14
95	1423.09
100	1421.55
105	1420.42
110	1419.37
115	1418.71
120	1417.81

#End of manufacturer data file