#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206466
Mfr serial number	STN12252-06466

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	29/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206466

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10354
I_LEAK350V (microA)	0.1523
Substr Origin	186
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.37
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.79
20	46.76
30	53.98
40	59.67
50	64.53
60	69.3
70	73.87
80	78.27
90	82.5
100	86.49
110	90.22
120	93.84
130	97.13
140	100.35
150	103.54
160	106.53
170	109.39
180	112.29
190	115.02
200	117.66
210	120.35
220	122.91
230	125.39
240	127.81
250	130.27
260	132.6
270	134.92
280	137.25
290	139.5
300	141.73
310	143.94
320	146.09
330	148.11
340	150.26
350	152.3
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2593.61
35	2307.15
40	2090.44
45	1922.08
50	1788.88
55	1679.06
60	1590.5
65	1522.51
70	1476.73
75	1450.4
80	1436.68
85	1429.85
90	1426.58
95	1424.42
100	1422.9
105	1421.8
110	1420.76
115	1419.87
120	1419.09

#End of manufacturer data file