#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206467
Mfr serial number	STN12252-06467

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	29/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206467

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09661
I_LEAK350V (microA)	0.14117
Substr Origin	186
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.37
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.41
20	43.21
30	49.67
40	54.75
50	59.27
60	63.98
70	68.49
80	72.79
90	76.88
100	80.68
110	84.22
120	87.58
130	90.68
140	93.67
150	96.61
160	99.39
170	102.1
180	104.76
190	107.28
200	109.8
210	112.25
220	114.6
230	116.92
240	119.14
250	121.38
260	123.53
270	125.63
280	127.75
290	129.79
300	131.76
310	133.77
320	135.69
330	137.54
340	139.41
350	141.17
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2614.49
35	2325.33
40	2105.78
45	1936.96
50	1802.08
55	1690.93
60	1600.62
65	1530.44
70	1482.29
75	1453.96
80	1439.06
85	1431.99
90	1428.32
95	1426.25
100	1424.65
105	1423.55
110	1422.19
115	1421.47
120	1420.7

#End of manufacturer data file