#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206642
Mfr serial number	STN12262-06642

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/12/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206642

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.09865
I_LEAK350V (microA)	0.14851
Substr Origin	204
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.79
R Bias Lower (MOhm)	1.63

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	10.568
20	45.43
30	51.6
40	56.25
50	60.37
60	64.68
70	69.29
80	73.87
90	78.1
100	82
110	85.6
120	89.02
130	92.4
140	95.57
150	98.65
160	101.62
170	104.58
180	107.39
190	110.14
200	112.84
210	115.53
220	118.12
230	120.65
240	123.16
250	125.61
260	128.1
270	130.49
280	132.85
290	135.07
300	137.49
310	139.72
320	141.94
330	144.14
340	146.37
350	148.51
	
#CV	
10	
15	O.L.
20	2850.41
25	2344.05
30	2025.43
35	1802.57
40	1640.2
45	1531.29
50	1472.02
55	1447.56
60	1438.07
65	1433.55
70	1430.72
75	1428.57
80	1426.86
85	1425.55
90	1424.32
95	1423.23
100	1422.32
105	1421.37
110	1420.57
115	1419.83
120	1419.04

#End of manufacturer data file