#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206644
Mfr serial number	STN12262-06644

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/12/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206644

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.09677
I_LEAK350V (microA)	0.14513
Substr Origin	204
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.79
R Bias Lower (MOhm)	1.63

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	18.645
20	44.96
30	50.99
40	55.52
50	59.51
60	63.6
70	67.97
80	72.38
90	76.53
100	80.43
110	83.98
120	87.36
130	90.65
140	93.79
150	96.77
160	99.71
170	102.6
180	105.34
190	108.02
200	110.63
210	113.28
220	115.78
230	118.27
240	120.65
250	123.07
260	125.39
270	127.79
280	130.07
290	132.29
300	134.54
310	136.69
320	138.83
330	140.93
340	143.08
350	145.13
	
#CV	
10	
15	O.L.
20	2853.82
25	2347.72
30	2029.18
35	1806.45
40	1643.87
45	1534.67
50	1474.18
55	1448.64
60	1438.73
65	1434.15
70	1431.17
75	1429.04
80	1427.28
85	1425.64
90	1424.41
95	1423.35
100	1422.4
105	1421.48
110	1420.6
115	1419.84
120	1419.18

#End of manufacturer data file