#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206650
Mfr serial number	STN12262-06650

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/12/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206650

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10214
I_LEAK350V (microA)	0.15692
Substr Origin	204
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.79
R Bias Lower (MOhm)	1.63

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	306																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	18.569
20	46.67
30	53.07
40	57.9
50	62.2
60	66.74
70	71.53
80	76.2
90	80.48
100	84.51
110	88.26
120	91.88
130	95.34
140	98.83
150	102.14
160	105.34
170	108.53
180	111.59
190	114.58
200	117.51
210	120.47
220	123.32
230	126.12
240	128.83
250	131.58
260	134.31
270	136.94
280	139.54
290	142.11
300	144.67
310	147.17
320	149.64
330	152.1
340	154.56
350	156.92
	
#CV	
10	
15	O.L.
20	2817.89
25	2317.65
30	2002.51
35	1782.62
40	1623.07
45	1520.65
50	1468.42
55	1447.6
60	1439.68
65	1435.46
70	1432.79
75	1430.72
80	1429
85	1427.5
90	1426.36
95	1425.25
100	1424.22
105	1423.35
110	1422.6
115	1421.78
120	1421.12

#End of manufacturer data file