#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206652
Mfr serial number	STN12262-06652

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/12/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206652

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10291
I_LEAK350V (microA)	0.15896
Substr Origin	204
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.79
R Bias Lower (MOhm)	1.63

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	14.846
20	46.52
30	53.05
40	57.96
50	62.3
60	66.88
70	71.65
80	76.3
90	80.68
100	84.83
110	88.7
120	92.42
130	96.09
140	99.55
150	102.91
160	106.04
170	109.4
180	112.55
190	115.61
200	118.65
210	121.68
220	124.59
230	127.45
240	130.24
250	133.04
260	135.81
270	138.52
280	141.16
290	143.77
300	146.41
310	148.96
320	151.48
330	153.99
340	156.51
350	158.96
	
#CV	
10	
15	O.L.
20	2809.5
25	2311.57
30	1998.4
35	1779.88
40	1621.89
45	1520.46
50	1469.03
55	1449.02
60	1441.01
65	1437.07
70	1434.36
75	1432.24
80	1430.56
85	1429.11
90	1427.78
95	1426.68
100	1425.74
105	1424.81
110	1424.05
115	1423.26
120	1422.49

#End of manufacturer data file