#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206777
Mfr serial number	STN12267-06777

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	13/12/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206777

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10088
I_LEAK350V (microA)	0.15467
Substr Origin	201
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	55
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.56

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	19.825
20	45.29
30	51.77
40	56.71
50	60.91
60	65.06
70	69.38
80	73.83
90	78.27
100	82.5
110	86.46
120	90.23
130	93.99
140	97.47
150	100.88
160	104.15
170	107.41
180	110.48
190	113.46
200	116.41
210	119.35
220	122.16
230	124.89
240	127.6
250	130.22
260	132.88
270	135.45
280	137.94
290	140.39
300	142.9
310	145.28
320	147.66
330	150.01
340	152.39
350	154.67
	
#CV	
10	
15	O.L.
20	2831.48
25	2331.91
30	2017.55
35	1797.58
40	1639.52
45	1535.13
50	1475.22
55	1445.9
60	1433.13
65	1427.32
70	1424.05
75	1421.88
80	1420.06
85	1418.52
90	1417.3
95	1416.29
100	1415.18
105	1414.32
110	1413.52
115	1412.74
120	1411.94

#End of manufacturer data file