#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900206779
Mfr serial number	STN12267-06779

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	13/12/2001
PROBLEM	NO
PASSED	YES
Run number	20220900206779

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11904
I_LEAK350V (microA)	0.17455
Substr Origin	201
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	55
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.56

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short	297																																							
Short	298																																							
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	37.4
20	57.45
30	65.9
40	72.02
50	76.85
60	81.43
70	86.04
80	90.79
90	95.5
100	99.99
110	104.12
120	108.05
130	111.93
140	115.52
150	119.04
160	122.41
170	125.76
180	128.92
190	131.98
200	135
210	138.04
220	140.91
230	143.73
240	146.49
250	149.22
260	151.96
270	154.62
280	157.22
290	159.76
300	162.34
310	164.83
320	167.28
330	169.7
340	172.18
350	174.55
	
#CV	
10	
15	O.L.
20	2865.99
25	2361.75
30	2042.55
35	1818.71
40	1654.42
45	1542.33
50	1475.97
55	1443.31
60	1429.42
65	1423.39
70	1419.94
75	1417.76
80	1416.07
85	1414.44
90	1413.26
95	1412.1
100	1411.07
105	1410.2
110	1409.26
115	1408.61
120	1407.82

#End of manufacturer data file