#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208009
Mfr serial number	STN12557-08009

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208009

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10303
I_LEAK350V (microA)	0.14818
Substr Origin	228
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	90
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.4

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.56
20	44.66
30	52.58
40	59.25
50	64.73
60	69.78
70	74.17
80	78.18
90	82.15
100	86.11
110	89.9
120	93.44
130	96.81
140	99.99
150	103.03
160	105.95
170	108.65
180	111.37
190	113.99
200	116.57
210	119.03
220	121.45
230	123.81
240	126.14
250	128.41
260	130.58
270	132.71
280	134.81
290	136.82
300	138.79
310	140.76
320	142.64
330	144.52
340	146.35
350	148.18
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2859.89
35	2539.16
40	2299.41
45	2114.43
50	1966.39
55	1843.75
60	1741.28
65	1654
70	1580.27
75	1520.27
80	1475.61
85	1445.09
90	1426.12
95	1415.4
100	1409.3
105	1406.16
110	1404.47
115	1403.12
120	1401.94

#End of manufacturer data file