#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208010
Mfr serial number	STN12557-08010

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208010

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09011
I_LEAK350V (microA)	0.12745
Substr Origin	228
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	95
R Bias Upper (MOhm)	1.46
R Bias Lower (MOhm)	1.4

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.7
20	40.4
30	47.99
40	53.65
50	58.22
60	62.39
70	66.16
80	69.54
90	72.79
100	76.04
110	79.15
120	82.11
130	84.92
140	87.57
150	90.11
160	92.52
170	94.78
180	97.03
190	99.2
200	101.34
210	103.41
220	105.42
230	107.37
240	109.33
250	111.18
260	112.97
270	114.65
280	116.36
290	118.04
300	119.67
310	121.27
320	122.83
330	124.39
340	125.92
350	127.45
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2916.53
35	2589.15
40	2344.22
45	2155.52
50	2004.46
55	1879.13
60	1774.24
65	1684.27
70	1607.97
75	1544.31
80	1493.61
85	1456.73
90	1432.6
95	1418.07
100	1409.84
105	1405
110	1402.47
115	1400.84
120	1399.42

#End of manufacturer data file