#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208100
Mfr serial number	STN12563-08100

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208100

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09276
I_LEAK350V (microA)	0.13531
Substr Origin	236
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	80
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.18

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.46
20	42.05
30	48.6
40	53.73
50	58.26
60	62.57
70	66.57
80	70.44
90	74.22
100	77.78
110	81.11
120	84.24
130	87.2
140	90.02
150	92.76
160	95.39
170	97.94
180	100.42
190	102.83
200	105.17
210	107.5
220	109.73
230	111.92
240	114.08
250	116.18
260	118.27
270	120.31
280	122.33
290	124.33
300	126.25
310	128.13
320	129.93
330	131.79
340	133.6
350	135.31
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2640.36
35	2348.81
40	2128.04
45	1958.05
50	1822.45
55	1710.36
60	1618.59
65	1545.89
70	1494.13
75	1461.62
80	1443.31
85	1433.85
90	1429.06
95	1426.45
100	1424.66
105	1423.53
110	1422.43
115	1421.59
120	1420.91

#End of manufacturer data file