#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208112
Mfr serial number	STN12563-08112

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208112

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09958
I_LEAK350V (microA)	0.1464
Substr Origin	237
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	75
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.18

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.83
20	43.88
30	50.89
40	56.37
50	61.47
60	66.34
70	70.87
80	75.28
90	79.38
100	83.27
110	86.83
120	90.27
130	93.48
140	96.58
150	99.58
160	102.44
170	105.23
180	107.95
190	110.58
200	113.18
210	115.66
220	118.15
230	120.54
240	122.93
250	125.23
260	127.53
270	129.79
280	132
290	134.21
300	136.26
310	138.33
320	140.37
330	142.42
340	144.4
350	146.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2944.8
30	2543.94
35	2262.88
40	2052.63
45	1889.36
50	1759.76
55	1653.71
60	1571.48
65	1511.93
70	1474.23
75	1453.85
80	1443.58
85	1438.46
90	1435.71
95	1433.9
100	1432.7
105	1431.59
110	1430.54
115	1429.86
120	1428.97

#End of manufacturer data file