#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208114
Mfr serial number	STN12563-08114

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208114

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09907
I_LEAK350V (microA)	0.14491
Substr Origin	237
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	70
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.18

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.69
20	43.84
30	50.77
40	56.31
50	61.21
60	65.91
70	70.49
80	74.94
90	79.14
100	82.91
110	86.56
120	89.92
130	93.15
140	96.17
150	99.07
160	102
170	104.72
180	107.36
190	110.01
200	112.54
210	115
220	117.42
230	119.8
240	122.12
250	124.4
260	126.66
270	128.85
280	131.01
290	133.12
300	135.18
310	137.19
320	139.17
330	141.14
340	143.04
350	144.91
	
#CV	
10	
15	O.L.
20	O.L.
25	2851.21
30	2462.69
35	2190.13
40	1986.4
45	1828.99
50	1703.99
55	1604.15
60	1530.68
65	1482.67
70	1455.58
75	1441.93
80	1435.37
85	1432.04
90	1430.1
95	1428.43
100	1427.43
105	1426.34
110	1425.38
115	1424.73
120	1423.93

#End of manufacturer data file