#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208115
Mfr serial number	STN12563-08115

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208115

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09573
I_LEAK350V (microA)	0.14051
Substr Origin	238
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	70
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.18

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.42
20	42.26
30	48.77
40	53.94
50	58.34
60	62.91
70	67.43
80	71.91
90	76
100	79.86
110	83.31
120	86.71
130	89.81
140	92.82
150	95.73
160	98.48
170	101.25
180	103.88
190	106.35
200	108.87
210	111.29
220	113.65
230	115.99
240	118.18
250	120.46
260	122.59
270	124.77
280	126.9
290	128.97
300	130.99
310	132.95
320	134.83
330	136.81
340	138.67
350	140.51
	
#CV	
10	
15	O.L.
20	O.L.
25	2807.16
30	2424.04
35	2155.09
40	1955.5
45	1800.41
50	1678.68
55	1583.44
60	1516.5
65	1474.96
70	1452.11
75	1441.05
80	1435.54
85	1432.63
90	1430.83
95	1429.5
100	1428.21
105	1427.26
110	1426.33
115	1425.6
120	1424.87

#End of manufacturer data file