#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900208116
Mfr serial number	STN12563-08116

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/02/2002
PROBLEM	NO
PASSED	YES
Run number	20220900208116

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10208
I_LEAK350V (microA)	0.14695
Substr Origin	238
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	85
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.18

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.54
20	45.64
30	53.11
40	59.18
50	64.96
60	70.12
70	74.4
80	78.39
90	82.29
100	86.07
110	89.63
120	92.99
130	96.15
140	99.18
150	102.08
160	104.88
170	107.58
180	110.22
190	112.75
200	115.22
210	117.65
220	120.03
230	122.35
240	124.65
250	126.87
260	129.08
270	131.26
280	133.35
290	135.41
300	137.4
310	139.33
320	141.27
330	143.22
340	145.1
350	146.95
	
#CV	
10	
15	O.L.
20	O.L.
25	O.L.
30	2805.07
35	2493.84
40	2258.04
45	2075.75
50	1930.85
55	1810.34
60	1710.47
65	1626.52
70	1558.34
75	1507.61
80	1472.46
85	1451.06
90	1439.23
95	1432.89
100	1429.48
105	1427.53
110	1426.14
115	1425.09
120	1424.25

#End of manufacturer data file